The mean wavelength in angstroms of radiation used to measure this reflection. This is an important parameter for data collected using energy-dispersive detectors or the Laue method. |
<xsd:element name="wavelength" minOccurs="0" maxOccurs="1" nillable="true"> <xsd:annotation> <xsd:documentation xml:lang="en">The mean wavelength in angstroms of radiation used to measure this reflection. This is an important parameter for data collected using energy-dispersive detectors or the Laue method.</xsd:documentation> </xsd:annotation> <xsd:simpleType> <xsd:restriction base="xsd:decimal"> <xsd:minInclusive value="0.0"/> </xsd:restriction> </xsd:simpleType> </xsd:element> |