Special details of the diffraction measurement process. Should include information about source instability, crystal motion, degradation and so on. |
<xsd:element name="details" minOccurs="0" maxOccurs="1" nillable="true" type="xsd:string"> <xsd:annotation> <xsd:documentation xml:lang="en">Special details of the diffraction measurement process. Should include information about source instability, crystal motion, degradation and so on.</xsd:documentation> </xsd:annotation> </xsd:element> |