PDBx:em_electron_diffraction_patternType 

data items in the em_electron_diffraction_pattern category
record details about the pattern information
from the electron diffraction experiment.
  example 1 - based on pdb entry 1tub and laboratory records for the
                structure corresponding to pdb entry 1tub
<PDBx:em_electron_diffraction_patternCategory>
   <PDBx:em_electron_diffraction_pattern entry_id="1TUB" id="1">
      <PDBx:num_images_by_tilt_angle>4</PDBx:num_images_by_tilt_angle>
      <PDBx:num_patterns_by_tilt_angle>1</PDBx:num_patterns_by_tilt_angle>
      <PDBx:tilt_angle xsi:nil="true" />
   </PDBx:em_electron_diffraction_pattern>
</PDBx:em_electron_diffraction_patternCategory>

Complex Type Information

Model

PDBx:em_electron_diffraction_pattern*
Children: PDBx:em_electron_diffraction_pattern

Used By

Element PDBx:datablockType/PDBx:em_electron_diffraction_patternCategory

Source 

<xsd:complexType name="em_electron_diffraction_patternType">
  <xsd:annotation>
    <xsd:documentation xml:lang="en">data items in the em_electron_diffraction_pattern category record details about the pattern information from the electron diffraction experiment. example 1 - based on pdb entry 1tub and laboratory records for the structure corresponding to pdb entry 1tub <PDBx:em_electron_diffraction_patternCategory> <PDBx:em_electron_diffraction_pattern entry_id="1TUB" id="1"> <PDBx:num_images_by_tilt_angle>4</PDBx:num_images_by_tilt_angle> <PDBx:num_patterns_by_tilt_angle>1</PDBx:num_patterns_by_tilt_angle> <PDBx:tilt_angle xsi:nil="true" /> </PDBx:em_electron_diffraction_pattern> </PDBx:em_electron_diffraction_patternCategory></xsd:documentation>
  </xsd:annotation>
  <xsd:sequence>
    <xsd:element name="em_electron_diffraction_pattern" minOccurs="0" maxOccurs="unbounded">
      <xsd:complexType>
        <xsd:all>
          <xsd:element name="num_images_by_tilt_angle" minOccurs="0" maxOccurs="1" nillable="true" type="xsd:integer">
            <xsd:annotation>
              <xsd:documentation xml:lang="en">the number of images by tilt angle. 4</xsd:documentation>
            </xsd:annotation>
          </xsd:element>
          <xsd:element name="num_patterns_by_tilt_angle" minOccurs="0" maxOccurs="1" nillable="true" type="xsd:integer">
            <xsd:annotation>
              <xsd:documentation xml:lang="en">the number of diffraction patterns by tilt angle. 1</xsd:documentation>
            </xsd:annotation>
          </xsd:element>
          <xsd:element name="tilt_angle" minOccurs="0" maxOccurs="1" nillable="true" type="xsd:integer">
            <xsd:annotation>
              <xsd:documentation xml:lang="en">the tilt angle at which the diffraction pattern was obtained.</xsd:documentation>
            </xsd:annotation>
          </xsd:element>
        </xsd:all>
        <xsd:attribute name="entry_id" use="required" type="xsd:string">
          <xsd:annotation>
            <xsd:documentation xml:lang="en">this data item is a pointer to attribute id in category entry in the entry category.</xsd:documentation>
          </xsd:annotation>
        </xsd:attribute>
        <xsd:attribute name="id" use="required" type="xsd:string">
          <xsd:annotation>
            <xsd:documentation xml:lang="en">the value of attribute id in category electron_diffraction_pattern must uniquely identify the electron diffraction pattern experiment.</xsd:documentation>
          </xsd:annotation>
        </xsd:attribute>
      </xsd:complexType>
    </xsd:element>
  </xsd:sequence>
</xsd:complexType>